Barker, Duncan James (2010)
Ph.D. thesis, University of Birmingham.
| AbstractA widely used analytical, image charge, model of the SNMM was analysed for the first time in terms of its ability to predict the response of the SNMM to both bulk and thin film dielectrics. For the first time it was shown that the uncertainty in fitting to the model reduces from 10% to 5% when the length of the tip protruding from within the cavity is reduced from 2mm to 1mm. A 5% uncertainty in fitting to the image charge model for the measurement of the relative permittivity of bulk samples is demonstrated. |
| Type of Work: | Ph.D. thesis. |
|---|---|
| Supervisor(s): | Jackson, Timothy James |
| School/Faculty: | Colleges (2008 onwards) > College of Engineering & Physical Sciences |
| Department: | School of Electronic, Electrical & Computer Engineering |
| Subjects: | TK Electrical engineering. Electronics Nuclear engineering TA Engineering (General). Civil engineering (General) QC Physics |
| Institution: | University of Birmingham |
| ID Code: | 1422 |
This unpublished thesis/dissertation is copyright of the author and/or third parties. The intellectual property rights of the author or third parties in respect of this work are as defined by The Copyright Designs and Patents Act 1988 or as modified by any successor legislation. Any use made of information contained in this thesis/dissertation must be in accordance with that legislation and must be properly acknowledged. Further distribution or reproduction in any format is prohibited without the permission of the copyright holder.
|
Repository Staff Only: item control page
